Название: Inside the TOEIC Exam Second Edition Автор: Kaplan Toeic Язык: English Издательство: Kaplan publishing Год: 2008 Формат: pdf Кол-во страниц: 211 Размер: 77 мб
Inside the TOEIC Exam helps test takers learn all the essential information they need to succeed on the day of the exam. This pocket-sized book provides extensive review and practice for each section of the test, special tactics for the Listening and Reading sections, as well as Kaplan’s proven score-raising strategies.
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